Voidage measurement based on genetic algorithm and electrical capacitance tomography
Wang Wei-wei, Wang Bao-liang, Huang Zhi-yao, Li Hai-qingVolume:
6
Langue:
english
Pages:
5
DOI:
10.1007/bf02888930
Date:
December, 2005
Fichier:
PDF, 389 KB
english, 2005