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[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Suntec City, Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - De-embedding comparisons of 1X-Reflect SFD, 1-port AFR, and 2X-Thru SFD
Chen, Yuan, Chen, Bichen, He, Jiayi, Zai, Richard, Fan, Jun, Drewniak, JamesAnnée:
2018
Langue:
english
DOI:
10.1109/ISEMC.2018.8393759
Fichier:
PDF, 599 KB
english, 2018