
Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale
Demers, Hendrix, Brodusch, Nicolas, Gauvin, RaynaldVolume:
23
Langue:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617003324
Date:
July, 2017
Fichier:
PDF, 284 KB
english, 2017