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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - ATPG power guards: On limiting the test power below threshold
Gulve, Rohini, Singh, VirendraAnnée:
2018
Langue:
english
DOI:
10.23919/DATE.2018.8342025
Fichier:
PDF, 210 KB
english, 2018