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[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Impact of BOX thickness and ground-plane on non-linearity of UTBB FD-SOI MOS transistors
Bhoir, Mandar S., Mohapatra, Nihar R.Année:
2018
Langue:
english
DOI:
10.1109/ULIS.2018.8354769
Fichier:
PDF, 587 KB
english, 2018