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High-sensitivity visualization of localized electric fields using low-energy electron beam deflection
Jeong, Samuel, Ito, Yoshikazu, Edwards, Gary, Fujita, Jun-ichiVolume:
57
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.065201
Date:
June, 2018
Fichier:
PDF, 1005 KB
english, 2018