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[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Rugged high-power mismatch characterization of a high-performance band 41 FBAR filter designed for HPUE applications
Bespalko, Dylan T., Ivira, BriceAnnée:
2017
Langue:
english
DOI:
10.1109/mwsym.2017.8058905
Fichier:
PDF, 1.25 MB
english, 2017