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[IEEE 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Sofia, Bulgaria (2017.5.10-2017.5.14)] 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Comparative shear tests of two low melting point solder pastes relating to their thermal diffusivity
Branzei, Mihai, Vladescu, Marian, Plotog, Ioan, Cucu, TraianAnnée:
2017
Langue:
english
DOI:
10.1109/ISSE.2017.8000937
Fichier:
PDF, 743 KB
english, 2017