[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Reliability studies of SiC vertical power MOSFETs
Lichtenwalner, Daniel J., Hull, Brett, Van Brunt, Edward, Sabri, Shadi, Gajewski, Donald A., Grider, Dave, Allen, Scott, Palmour, John W., Akturk, Akin, McGarrity, JamesAnnée:
2018
Langue:
english
DOI:
10.1109/IRPS.2018.8353544
Fichier:
PDF, 929 KB
english, 2018