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[IEEE 2017 IEEE International Conference on Electro Information Technology (EIT) - Lincoln, NE, USA (2017.5.14-2017.5.17)] 2017 IEEE International Conference on Electro Information Technology (EIT) - On the impact of the death criterion on the WSN lifetime
Nouh, Sara, Khattab, Ahmed, Soliman, Samy S., Daoud, Ramez M., Amer, Hassanein H.Année:
2017
Langue:
english
DOI:
10.1109/eit.2017.8053328
Fichier:
PDF, 726 KB
english, 2017