X-ray diffraction study of chemical bonds under external electric field
Gorfman, S., Schmidt, O., Schmidt, M., Borrmann, H., Grin, Y., Tsirelson, V., Pietsch, U.Volume:
62
Langue:
english
Journal:
Acta Crystallographica Section A Foundations of Crystallography
DOI:
10.1107/S0108767306096590
Date:
August, 2006
Fichier:
PDF, 43 KB
english, 2006