
[IEEE 2017 9th International Conference on Knowledge and Systems Engineering (KSE) - Hue (2017.10.19-2017.10.21)] 2017 9th International Conference on Knowledge and Systems Engineering (KSE) - Inconsistency measures for probabilistic knowledge bases
Nguyen, Van Tham, Tran, Trong HieuAnnée:
2017
Langue:
english
DOI:
10.1109/KSE.2017.8119450
Fichier:
PDF, 134 KB
english, 2017