On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability
Lunardi, Caio, Previlon, Fritz, Kaeli, David, Rech, PaoloAnnée:
2018
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2823786
Fichier:
PDF, 2.41 MB
english, 2018