
Electron microscopy of native xanthan and xanthan exposed to low ionic strength
Bjørn T. Stokke, Olav Smidsrød, Arnljot ElgsaeterVolume:
28
Année:
1989
Langue:
english
Pages:
21
DOI:
10.1002/bip.360280207
Fichier:
PDF, 1.76 MB
english, 1989