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Impact of rounded electrode corners on breakdown characteristics of AlGaN/GaN high-electron mobility transistors
Yamazaki, Taisei, Asubar, Joel T., Tokuda, Hirokuni, Kuzuhara, MasaakiVolume:
11
Langue:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.11.054102
Date:
May, 2018
Fichier:
PDF, 952 KB
english, 2018