[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Rapid diagnostics of advanced standard cell using laser voltage probing and dynamic laser stimulation
Chen, Li-Qing, Sun, Ming-Sheng, Chao, Jui-Hao, Su, Ke, Zhao, Zhe, Lin, Guang-QiAnnée:
2017
Langue:
english
DOI:
10.1109/IPFA.2017.8060164
Fichier:
PDF, 543 KB
english, 2017