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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - An interdigitated GaN MIS-HEMT/SBD normally-off power switching device with low ON-resistance and low reverse conduction loss
Lei, Jiacheng, Wei, Jin, Tang, Gaofei, Qian, Qingkai, Hua, Mengyuan, Zhang, Zhaofu, Zheng, Zheyang, Chen, Kevin J.Année:
2017
DOI:
10.1109/IEDM.2017.8268456
Fichier:
PDF, 606 KB
2017