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Source/Drain Engineered Charge-Plasma Junctionless Transistor for the Immune of Line Edge Roughness Effect
Wan, Wenbo, Lou, Haijun, Xiao, Ying, Lin, XinnanAnnée:
2018
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2812241
Fichier:
PDF, 2.21 MB
english, 2018