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[IEEE 2017 IEEE AUTOTESTCON - Schaumburg, IL, USA (2017.9.9-2017.9.15)] 2017 IEEE AUTOTESTCON - FPGA based data acquisition and test system design for diagnostic testing
Onder, Nazire Merve, Cakmak, Muhammet Can, Unver, OnderAnnée:
2017
Langue:
english
DOI:
10.1109/autest.2017.8080479
Fichier:
PDF, 1.39 MB
english, 2017