[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - High performance bipolar resistive switching characteristics in SiO2/ZrO2/SiO2 tri-layer based CBRAM device
Kumar, Dayanand, Aluguri, Rakesh, Chand, Umesh, Tseng, Tseung-YuenAnnée:
2017
Langue:
english
DOI:
10.1109/edssc.2017.8126482
Fichier:
PDF, 344 KB
english, 2017