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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Modeling steep slope devices: From circuits to architectures
Swaminathan, Karthik, Kim, Moon Seok, Chandramoorthy, Nandhini, Sedighi, Behnam, Perricone, Robert, Sampson, Jack, Narayanan, VijaykrishnanAnnée:
2014
Langue:
english
DOI:
10.7873/date2014.149
Fichier:
PDF, 499 KB
english, 2014