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[IEEE International Symposium on Electronic Materials and Packaging (EMAP2000) - Hong Kong, China (30 Nov.-2 Dec. 2000)] International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458) - Study on failure mode of solder bump fabricated using eutectic solder electroplating process
Guo-wei Xiao,, Chan, P.C.H., Teng, A., Jian Cai,, Yuen, M.M.F.Année:
2000
Langue:
english
DOI:
10.1109/emap.2000.904129
Fichier:
PDF, 1.44 MB
english, 2000