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[IEEE 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Limassol (2017.9.12-2017.9.15)] 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Cardinality-based variability modeling with AutomationML
Wimmer, Manuel, Novak, Petr, Sindelar, Radek, Berardinelli, Luca, Mayerhofer, Tanja, Mazak, AlexandraAnnée:
2017
Langue:
english
DOI:
10.1109/ETFA.2017.8247711
Fichier:
PDF, 325 KB
english, 2017