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[IEEE 2017 2nd International Conference on System Reliability and Safety (ICSRS) - Milan, Italy (2017.12.20-2017.12.22)] 2017 2nd International Conference on System Reliability and Safety (ICSRS) - Vulnerability analysis of storage elements in HLS-generated designs using high-level profiling
Fibich, Christian, Horauer, Martin, Obermaisser, RomanAnnée:
2017
Langue:
english
DOI:
10.1109/ICSRS.2017.8272819
Fichier:
PDF, 249 KB
english, 2017