Study on EMI Characteristics of the Superjunction DMOS in Flyback Converter System
Zhu, Jing, Li, Shaohong, Sun, Weifeng, Yang, Zhuo, Sun, Yi, Zhou, Jincheng, Chen, Jian, Shi, Longxing, Ye, Peng, Li, ZongqingVolume:
17
Langue:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2750720
Date:
December, 2017
Fichier:
PDF, 1.53 MB
english, 2017
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