[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Near-field scanning of stochastic fields considering reduction of complexity
Thomas, David W. P., Baharuddin, Mohd H., Smartt, Christopher, Gradoni, Gabriele, Tanner, Gregor, Creagh, Stephen, Doncov, Nebojsa, Haider, Michael, Russer, Johannes A.Année:
2017
Langue:
english
DOI:
10.1109/EMCEurope.2017.8094766
Fichier:
PDF, 1.40 MB
english, 2017
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