Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC–AC Experimental Conditions
Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, SouvikVolume:
65
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2773122
Date:
January, 2018
Fichier:
PDF, 6.30 MB
english, 2018
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