
[IEEE 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boston, MA, USA (2017.8.6-2017.8.9)] 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS) - Area efficient soft error tolerant RISC pipeline: Leveraging data encoding and inherent ALU redundancy
Hasan, Syed Rafay, Tangellapalli, PhaniAnnée:
2017
Langue:
english
DOI:
10.1109/MWSCAS.2017.8053019
Fichier:
PDF, 477 KB
english, 2017