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[IEEE 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Honolulu, HI, USA (2017.7.21-2017.7.26)] 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Multi-Resolution Data Fusion for Super-Resolution Electron Microscopy
Sreehari, Suhas, Venkatakrishnan, S. V., Bouman, Katherine L., Simmons, Jeffrey P., Drummy, Lawrence F., Bouman, Charles A.Année:
2017
Langue:
english
DOI:
10.1109/CVPRW.2017.146
Fichier:
PDF, 1.75 MB
english, 2017