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High-speed polarized light microscopy for in situ , dynamic measurement of birefringence properties
Wu, Xianyu, Pankow, Mark, Shadow Huang, Hsiao-Ying, Peters, KaraVolume:
29
Langue:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/1361-6501/aa9084
Date:
January, 2018
Fichier:
PDF, 3.70 MB
english, 2018