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Heated ion implantation for high-performance and highly reliable silicon-on-insulator complementary metal–oxide–silicon fin field-effect transistors
Mizubayashi, Wataru, Onoda, Hiroshi, Nakashima, Yoshiki, Ishikawa, Yuki, Matsukawa, Takashi, Endo, Kazuhiko, Liu, Yongxun, O’uchi, Shinichi, Tsukada, Junichi, Yamauchi, Hiromi, Migita, Shinji, Morita,Volume:
54
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.54.04DA06
Date:
April, 2015
Fichier:
PDF, 1.92 MB
english, 2015