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Solder Joint Reliability of Wafer Level Chip Scale Packages (WLCSP): A Time-Temperature-Dependent Creep Analysis
Lau, John H., Lee, S.-W. Ricky, Chang, ChrisVolume:
122
Année:
2000
Langue:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.1289769
Fichier:
PDF, 700 KB
english, 2000