
[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Dead time effects in the indirect time-of-flight measurement with SPADs
Beer, Maik, Schrey, Olaf, Hosticka, Bedrich J., Kokozinski, RainerAnnée:
2017
Langue:
english
DOI:
10.1109/ISCAS.2017.8050357
Fichier:
PDF, 294 KB
english, 2017