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Oxide composition studies of electrochemically grown tantalum oxide on sintered tantalum using XPS depth-profiling and co-relation with leakage properties
Chakraborti, Parthasarathi, Sharma, Himani, Pulugurtha, Markondeya Raj, Gandhi, Saumya, Tummala, Rao R.Langue:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-017-7826-1
Date:
September, 2017
Fichier:
PDF, 3.65 MB
english, 2017