[AIP PHYSICS OF SEMICONDUCTORS: 28th International Conference on the Physics of Semiconductors - ICPS 2006 - Vienna (Austria) (24-28 July 2006)] AIP Conference Proceedings - Evaluation of Concentration of Deep Levels from Photoelectric Measurements in Wide Gap High-Resistivity Semiconductors
Franc, Jan, Hőschl, Pavel, Kubát, Jan, Grill, Roman, Hlídek, Pavel, Belas, EduardVolume:
893
Année:
2007
Langue:
english
DOI:
10.1063/1.2729886
Fichier:
PDF, 1.28 MB
english, 2007