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Structural and spectroscopic analysis of ex-situ annealed RF sputtered aluminium doped zinc oxide thin films
Otieno, Francis, Airo, Mildred, Erasmus, Rudolph M., Billing, David G., Quandt, Alexander, Wamwangi, DanielVolume:
122
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4998939
Date:
August, 2017
Fichier:
PDF, 8.33 MB
english, 2017