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Lifetime limitations in organic electronic devices due to metal electrochemical migration
Abbel, Robert, van de Peppel, Linda, Kirchner, Gerwin, Michels, Jasper J., Groen, PimLangue:
english
Journal:
MRS Communications
DOI:
10.1557/mrc.2017.46
Date:
July, 2017
Fichier:
PDF, 775 KB
english, 2017