In Situ Growth of Al 2 O 3 as a Passivation and Antireflection Layer on TiO 2 -Based MSM Photodetectors
Liu, Han-Yin, Liu, Guan-Jyun, Huang, Ruei-Chin, Sun, Wen-Ching, Wei, Sung-Yen, Yu, Sheng-MinVolume:
17
Langue:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2017.2724061
Date:
August, 2017
Fichier:
PDF, 374 KB
english, 2017