[IEEE 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Seoul, South Korea (2017.6.20-2017.6.23)] 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - A threat of malicious hardware using on-chip voltmeter
Fujimoto, Daisuke, Miyachi, Ryo, Matsumoto, TsutomuAnnée:
2017
Langue:
english
DOI:
10.1109/APEMC.2017.7975434
Fichier:
PDF, 370 KB
english, 2017