Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model
V. M. Barbashov,O. A. KalashnikovVolume:
46
Langue:
english
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739717030027
Date:
May, 2017
Fichier:
PDF, 572 KB
english, 2017