Investigation on the Robustness During Short-Circuit Turn-OFF and Its Tradeoff Characteristics With Performance in IGBTs
Yang, Fei, Tan, Ji, Lu, Shuojin, Zhu, YangjunAnnée:
2017
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2717450
Fichier:
PDF, 1.04 MB
english, 2017