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Al 0.30 Ga 0.70 N/GaN/Al 0.07 Ga 0.93 N Double Heterostructure High Electron Mobility Transistors with a Record Saturation Drain Current of 1050mA/mm
Li, Xiang-Dong, Zhang, Jin-Cheng, Guo, Zhen-Xing, Jiang, Hai-Qing, Zou, Yu, Zhang, Wei-Hang, He, Yun-Long, Jiang, Ren-Yuan, Zhao, Sheng-Lei, Hao, YueVolume:
32
Langue:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/32/11/117202
Date:
November, 2015
Fichier:
PDF, 1.15 MB
english, 2015