
Bipolar Resistive Switching Characteristics of HfO2/TiO2/HfO2Trilayer-Structure RRAM Devices on Pt and TiN-Coated Substrates Fabricated by Atomic Layer Deposition
Wei Zhang,Ji-Zhou Kong,Zheng-Yi Cao,Ai-Dong Li…Volume:
12
Langue:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/s11671-017-2164-z
Date:
December, 2017
Fichier:
PDF, 3.87 MB
english, 2017