Effects of Implantation Sequence on the Micro-defects in H and O Implanted Silicon
Wang, Zhuo, Yang, Lin, Zhang, Li-Zhu, Shi, Shao-Bo, Zhang, Peng, Cao, Xing-Zhong, Wang, Bao-YiVolume:
45
Langue:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-4698-8
Date:
October, 2016
Fichier:
PDF, 788 KB
english, 2016