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New Atomic Force Microscope Facilitates Faster Workflow for Nanoscale In Situ Applications
Rankl, Christian, Kada, Gerald, Wu, Shijie, Ghimire, AnilVolume:
24
Langue:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929516000924
Date:
November, 2016
Fichier:
PDF, 11.76 MB
english, 2016