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[IEEE 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST) - Tokyo, Japan (2017.3.13-2017.3.17)] 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST) - Accelerating Test Automation through a Domain Specific Language
Dwarakanath, Anurag, Era, Dipin, Priyadarshi, Aditya, Dubash, Neville, Podder, SanjayAnnée:
2017
Langue:
english
DOI:
10.1109/ICST.2017.52
Fichier:
PDF, 566 KB
english, 2017