Effects of annealing temperature on the electrical characteristics of Li–N co-doped polycrystalline ZnO thin film transistors
Tian, Longjie, Zhou, Dongzhan, Ma, Yaobin, Zhang, Xiqing, Wang, YongshengLangue:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2017.05.003
Date:
May, 2017
Fichier:
PDF, 1.95 MB
english, 2017
File converter
Plus de résultats de recherche
More benefits 
