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Direct evidence of barrier inhomogeneities at metal/AlGaN/GaN interfaces using nanoscopic electrical characterizations
Kumar, Ashutosh, Kapoor, Raman, Garg, Manjari, Kumar, Vikram, Singh, RajendraLangue:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aa72d3
Date:
May, 2017
Fichier:
PDF, 1.70 MB
english, 2017