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Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques
Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.Volume:
119
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4939305
Date:
January, 2016
Fichier:
PDF, 1.02 MB
english, 2016