
[IEEE 2017 18th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2017.3.14-2017.3.15)] 2017 18th International Symposium on Quality Electronic Design (ISQED) - Design technology co-optimization of back end of line design rules for a 7 nm predictive process design kit
Vashishtha, Vinay, Dosi, Ankita, Masand, Lovish, Clark, Lawrence T.Année:
2017
Langue:
english
DOI:
10.1109/ISQED.2017.7918308
Fichier:
PDF, 494 KB
english, 2017